Inductance and capacitance measurement device (Question C) [Undergraduate Group]
1. Task
Based on TI's MCU, a measuring device for inductance and its quality factor Q, capacitance and its loss tangent D is designed and produced. After the component under test is connected and started with one click, the measurement will be automatically completed within the specified time. The measuring device should provide a signal output interface dedicated to monitoring the test frequency for real-time monitoring of the test frequency of the device, as shown in Figure 1.
2. Requirements
1. Basic requirements
Complete the measurement of capacitance and its loss tangent D.
- (1) Capacitance measurement range: 1nF ~ 100nF, the absolute value of the relative measurement error is not greater than 5%.
- (2) Capacitance D value measurement range: 0.005 ~ 1, the absolute value of the relative measurement error is not greater than 5%.
- (3) Customize a fixed measurement frequency within the range of 1kHz to 100kHz.
- (4) The measurement time is no more than 1 second.
2. Play part
Complete the measurement of the inductance and its quality factor Q.
- (1) Inductance measurement range: 10μH ~ 100μH, the absolute value of the relative measurement error is not greater than 5%.
- (2) Inductor Q value measurement range: 1 ~ 200, the absolute value of the relative measurement error is not greater than 5%.
- (3) The device can measure in two frequency ranges of no higher than 2MHz and no lower than 20MHz respectively, and the measurement frequency can be customized.
- (4) The measurement time shall not exceed 5 seconds.
- (5) Others.
3. Description
- (1) All processors of this measurement display device must use MCUs from TI (the specific model is not limited), otherwise it will be considered a violation and will not be tested.
- (2) Participating teams need to prepare their own commercial measuring instruments, referred to as self-prepared measuring instruments, in order to calibrate their own measuring devices. During the evaluation, the measurement value of the self-prepared measuring instrument is used as the standard value to calculate the measurement error.
- (3) It is recommended that the test frequency of self-made measuring devices be consistent with that of self-prepared measuring instruments.
- (4) Equivalent impedance components can be formed by connecting resistors in parallel or in series to calibrate the parameters of the self-made measuring device.
4. Scoring Criteria
Open source reference for excellent works (source: Lichuang Open Source Platform)
- Jialichuang : https://lceda.cn/
- LiChuang open source platform : https://oshwhub.com/
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