1. Range of functions:
EN-1230A can control various dynamic parameters such as turn-on time and turn-off time of discrete devices such as Si·diode, Si·MOSFET, Si·IGBT, SiC·diode, SiC·MOSFET, SiC·IGBT, etc. , Rise time, fall time, turn-on delay time, turn-off delay time, turn-on loss, turn-off loss, total gate charge, gate-source charging power, platform voltage, reverse recovery time, reverse recovery charging power, reverse Recovery current, reverse recovery loss, reverse recovery current rate of change, reverse recovery voltage rate of change, collector short-circuit current, input capacitance, output capacitance, reverse transfer capacitance, gate series equivalent resistance, and avalanche tolerance are tested.
2. Environmental requirements
1. Ambient temperature: 15-40℃
2. Relative humidity: storage humidity is not more than 70%
3. Atmospheric pressure: 86Kpa—106Kpa
4. Power grid voltage: AC220V±10% without serious harmonics
5. Power grid frequency: 50Hz±1Hz
6. Power: 20KW
7. Power factor of power supply grid:> 0.9
8. Gas source requirement: ≥ 0.6Mpa
9. No large dust, corrosive or explosive gas, conductive dust and other air pollution damage.
3. Main technical indicators: The
requirements of the equipment technical indicators are as follows:
1. (Resistive/inductive) switch test unit
•Drain voltage test range: 5V-1500V, 5V-100V, step 0.1V,
100V-1500V, step 1.0 V;
•Drain current test range: 1A-300A, resolution 1A;
•Gate drive: ±30V, resolution 0.1V;
•Maximum gate current: 2A;
•Maximum pulse current: 300A;
•Power supply voltage (VDD ): 5V-100V, stepping 0.1V,
100V-1500V, stepping 1.0V.
• Pulse width: 1us-100us, step 0.1us
• Time test accuracy: 1ns;
• Inductive load: 0.01mH-160mH program control, step 10uH;
• Resistive load: 1Ω, 2Ω, 5Ω, 10Ω, 50Ω, program Control, spare three resistors for selection when using.
• Turn on/off time ton/toff: 5-10000ns
• Turn on/off delay td(on)/td(off): 5-10000ns
• Rise/fall time tr/tf: 5-10000ns
minimum resolution 1ns
• Turn on/off loss Eon/Eoff: 1-2000mJ
minimum resolution Rate 1uJ
2. Gate charge unit
•Drive current: 0-2mA, resolution 0.01mA,
2-20mA, resolution 0.1mA;
20mA-200mA, resolution 1mA.
•Gate voltage: ±30V, resolution 0.1V;
•Constant current source load: 1-25A, resolution 0.1A,
25-300A, resolution 1A;
•Drain voltage: 5-100V, step 0.1V,
100-1500V, stepping 1.0V.
• Gate charge Qg: 1nC-100µC
• Drain charge Qgs: 1nC-100µC
• Source charge Qgd: 1nC-100µC
• Threshold charge Qgth: 1nC-100µC
Minimum resolution 1nC
• Platform voltage Vgp: -30-0V, resolution Rate 0.1V
0-30V, resolution 0.1V
3. Reverse recovery test unit
• Forward current: 1A-25A, resolution 0.1A,
25A-300A, resolution 1A;
• Reverse voltage: 5v-100V, step Enter 0.1V,
100V-1500V, step 1.0v;
•Reverse recovery time Trr: 10ns-10000ns, minimum resolution 1ns;
•Reverse recovery charge Qrr: 1nC-100µC, minimum resolution 1nC;
•Reverse recovery current Irm: 1A-300A;
•Reverse recovery loss Erec: 1-2000mJ, the minimum resolution is 1uJ;
•The current drop rate dif/dt: 50-10kA/us;
•The current recovery rate dir/dt: 50-5kA/us
•dv/dt: 50-10kV/us.
• Ta, Tb, SF (softness factor)
4. Reverse bias safe working area RBSOA
• 600A (under 2 times the rated current, the voltage and current are turned off during the test).
5. Short-circuit safe working area SCSOA
• One-time short-circuit current Isc: 1A-1000A, resolution 1A;
• Pulse width 5us-10us, stepping 0.1us.
6.
Sweep frequency range of junction capacitance and capacitance test: 0.1MHz～1MHz;
• Drain-source voltage: 200V, resolution 1V.
•Ciss, Coss, Cres
7, gate resistance
•Gate resistance range: 0.1～50ohm; resolution 0.1Ω;
•Drain bias voltage: 0～1500V;
•Gate bias: ±20V.
8. Avalanche tolerance
• Maximum avalanche breakdown voltage ≥2500V;
• Avalanche current: 200A;
• Inductive load: 0.01mH～100mH continuously adjustable, step 10μH;
• Single avalanche and repeated avalanche can be tested.
9. E-En Electric operating system function The
system adopts a graphical operation interface, which is friendly and easy to operate, and has the editing function of control and monitoring interface.
The system can record, calculate, store, and analyze the data during the test in real time; the acquisition and recording frequency requirements are consistent with the oscilloscope sampling frequency, and the oscilloscope scale and sampling points can be set.
During the performance test of the tested product, it can monitor the test power supply, measure and analyze the relevant electrical parameters in real time, can monitor the parameters of the tested product in real time, and can monitor the temperature of the heated substrate in real time, according to the collected values and limits Alarms related to the value; test parameters and related monitoring parameters can be displayed and set on the software.
The equipment can detect the state of the system, if the system is faulty, it can send out fault signals and prompt for major faults.
The device can realize the control function of the system with the help of I/O in the virtual instrument system.
The equipment is highly automated, enabling data background processing and analysis, and uploading data to the background database for real-time monitoring and comparison.
During the test, if some test unit fails, you can manually end the test.
Realize the integrated processing function of computer instruction information and status information from the test platform.
When the device under test is short-circuited, the system has short-circuit detection and protection functions.
The test load inductance can be automatically switched through the test system.
Input the code model of the device under test through the scanner.
The equipment realizes the data collection and processing through the computer, and displays the test results of different parameters.
When the device under test is short-circuited, the system has short-circuit detection and protection functions.
The safety system of the test platform is composed of the test circuit and power supply, various protections, door safety systems, etc. The equipment cannot be charged unless the back door of the equipment is closed.
The test fixture is a fixed independent system, and different devices are equipped with different adapters.
The equipment is equipped with an emergency stop function.
The technology of each part of the test bench is mature and reliable, the structure is as compact as possible, the appearance is beautiful, and it has good test stability.
High-voltage capacitors have discharge facilities and safety grounding switches. When the equipment is not working, all capacitors are safely grounded; the
operating fixture is equipped with a safety grounding switch, and the tested output terminal is safely grounded when the equipment is not tested; the
operating window is equipped with a safety pneumatic Door and safety grating equipment to prevent the operator's hand from being pinched;