1. Overview of IGBT power cycle reliability test equipment
This test equipment can perform power cycle durability tests on high-power IGBT devices to confirm the ability of IGBT devices to withstand junction temperature fluctuations, and judge the internal manufacturing of IGBT devices through changes in various electrical parameters before and after the test Process reliability and device lifespan, used to study the fatigue failure and life prediction methods of high-power IGBTs in power electronic converters, simulate the impact of temperature gradient impact on chips and packaging materials during device operation, and provide a basis for evaluating device lifespan . It is an indispensable test equipment for IGBT testing.
The test standard meets the requirements of GB/T17573-1998 and IEC60747-9 related standards. This equipment adopts computer automatic control system, background software real-time monitoring and automatic processing of target data. It has the advantages of high test accuracy, convenient operation and high efficiency.
This test equipment is composed of high-power programmable constant current source, cooling water system, modular device clamping system, K factor, steady-state and transient thermal resistance value test system, control system and data acquisition system. The equipment can test 12 modular IGBT devices at the same time, with a maximum test current of 1800A, which can monitor and measure various parameters during power cycling of IGBT devices. The equipment is programmed with the automatic control program in LabVIEW language. When using, set the working condition parameters according to the test conditions, save, call and run the test program, then the test process can be automatically completed, during which temperature, current, pressure drop, cycle times, on-off Time and other data are recorded and saved, and the temperature change curve can be displayed on the computer screen; the test data is output as an excel file. The equipment is also equipped with a high and low temperature test box, which can be used to test the K factor, the thermal resistance of the junction and the transient thermal resistance. The system is safe, reliable and stable.
The equipment is controlled by Advantech industrial computer and programmed by LabVIEW software program. The heating time, cooling time, and number of cycles can be set on the computer interface. The grid trigger voltage, Vce data, and device temperature of the device can be displayed and displayed on the computer. Output in excel form. The device applies a constant small current to monitor the thermal voltage of the device.
2. Environmental conditions for use : Ambient
temperature: 5～35℃; Relative
humidity: 20%-70%;
Atmospheric pressure: 86Kpa～106Kpa; Grid
: 380V; three-phase five-wire Grid
frequency: 50Hz±1Hz; Power
supply grid power: less than 100KVA
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