High and low temperature aging test method for electronic products with full load

1. Purpose
All kinds of electronic equipment have the requirements of working environment temperature, so we have to simulate the high and low extreme temperature of the environment to do full load aging test to ensure that the power supply can work normally under the environment temperature. If the power board is tested separately, it is necessary to monitor its ripple output voltage. If the whole machine is tested, it depends on the performance index of each output port and whether it can be turned on and off normally.

2. Test equipment
Digital oscilloscope, DC electronic load, high and low temperature test box.

3. Test method
1. If you test separately, first set the DC electronic load and set the load to the maximum load required in the specification. Connect to the whole machine when it is equipped with the whole machine test.
2. Set the oscilloscope, set AC coupling in the oscilloscope menu, 20M bandwidth; call out the peak-to-peak voltage display from the measuring device.
3. Connect the probe of the oscilloscope to the output port of the power supply, and connect a 0.1UF ceramic capacitor and a 10UF electrolytic capacitor in parallel to the probe.
4. Set the power supply voltage to the lowest point (90V) required by the power supply, generally speaking The efficiency of the power supply is lowest at 90V, so we choose 90V.
5. Put the power supply and load into the high and low temperature test box together, set the maximum temperature or the minimum temperature, and wait for the temperature to reach the set point for half an hour before powering on the power supply.
6. The aging time is not less than 24 hours.

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Origin blog.csdn.net/Tina13580912926/article/details/108791220