*Tested product: chip semiconductor device. Nano software ATECLOUD-IC chip automatic test system is suitable for diodes, triodes, insulated gate field effect transistors, junction field effect transistors, one-way and two-way thyristors, ordinary and high-speed optocouplers, rectifier bridges, common cathode and common anode diodes And multi-array devices and other semiconductor discrete device comprehensive performance automated testing.
*Tested items: temperature test, withstand voltage test, pin reliability test, ESD anti-interference test, operation test, X-ray intrusion test, etc.
*Test scenarios: R&D test, production line test, burn-in test, first test and second test, etc.
ATECLOUD-IC can test product types
Automation of semiconductor discrete devices such as diodes, triodes, insulated gate field effect transistors, junction field effect transistors, unidirectional and bidirectional thyristors, ordinary and high-speed optocouplers, rectifier bridges, common cathode and common anode diodes, and multi-array devices test
The difference between ATECLOUD-IC and traditional chip test system
ATECLOUD-IC solves testing pain points
☁ Manual testing is inefficient and needs to improve testing efficiency and accuracy;
☁ There are a wide variety of test products and various test methods, and customers need flexible solutions to adapt to future changes and needs;
☁ The amount of recorded test data is large and error-prone, and it is necessary to improve test efficiency and accuracy;
☁ Long time testing, heavy workload, need to reduce testing cost;
☁ The iteration of the existing software system is cumbersome and time-consuming, and cannot continue to be compatible with new products;
☁ Need to meet specific testing requirements, such as purchased accessories, etc.;
☁ Need to comply with its own chip test method;
☁ Need to find localization alternatives;
ATECLOUD-IC test item list
ATECLOUD-IC test instrument and accessories
The system integrates a variety of test instruments through GPIB, RS232, LAN, USB and other communication methods. The system is compatible with various brands of instrument models, which can comprehensively reduce the cost of enterprise product testing, improve product test efficiency, intelligently analyze test data, and comprehensively improve enterprise product production. quality.
Users can freely select instruments: compatible with more than 2,000 instruments of different manufacturers and models, and will not be limited by fixed hardware, economical and applicable.
ATECLOUD-IC function introduction
Quick solution building, one-click running test
● Support multiple test item configurations and reusable, batch testing
● Automatically store test data and image data
● Equipped with device self-check function, prompting Party A that the device is offline or does not exist
● Real-time observation of the test process to automatically determine whether the product is qualified
ATECLOUD-IC chip test platform solution building interface
ATECLOUD-IC chip test platform running test interface
record report
● Historical test list display: The completed historical tests are displayed in a list form, and can be queried according to the key information, time and other conditions of the test.
● Detailed historical test information: For each historical test, you can view basic test information, test time information, test alarm record information, test data monitoring information, and further query the historical records of each monitoring point.
Data Insights, Unleash the Unlimited Value of Data
● Data authority: create data kanban for different management levels, efficient production;
● Customized analysis chart: Party A can customize the analysis chart to show the production process in multiple levels and dimensions;
● Data import and connection: support system and external data import, and data connection with other systems;
● Big data and cloud computing: make full use of big data and cloud computing to give full play to the unlimited value of data;
● Generate charts: Supports generating charts to facilitate data analysis.
Data overview diagram
Data chart diagram
Some cooperative customers of ATECLOUD-IC platform
Application case of ATECLOUD-IC platform
A power management chip manufacturer in Shanghai
Product under test: power management chip
Some test items of ATECLOUD-Power
Chip semiconductor automatic test system details: www.namisoft.com/Softwarecenterdetail/1220.html