How much do you know about the chip test (Wafer Level)...

DFT design is a very important link in the chip design process, and its purpose is to provide an efficient and fast test method for Wafer Level test. What content is to be measured in the Wafer Level test, the following will describe them one by one.


The above are the commonly used test methods for chip Wafer Level testing. This is an introduction. We will launch more practical articles for DFT in the future, please continue to pay attention.
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