1. Product overview
ENS1040 diode reverse recovery test system is a reverse recovery test bench for ordinary diodes, fast recovery diodes, etc., developed according to component test parameter requirements. The test method complies with the International Electrotechnical Commission's IEC standard and the national standard GB4938. This set of test equipment can test the following parameters: suitable for fast diode reverse currents with a maximum reverse current less than 400A (expandable), forward current less than 1-400A (expandable), and a voltage range of 50V-1200V (expandable) Recovery characteristics test. The test bench generates current waveforms based on the principle of capacitor charging and discharging. During testing, the test voltage is set according to different test conditions, and different test pulse widths are selected to output the current value required by the test, and then adjusted according to the required reverse di/dt inductance. The voltage and current waveforms tested are collected to the oscilloscope at the same time, and the oscilloscope directly communicates with the industrial computer, and transmits the collected data to the computer. After the computer is processed and calculated, the test data is displayed in a table form and can be edited and printed.
2. Specification environment
Working voltage: three-phase five-wire system AC380V±10%, or single-phase three-wire system AC220V±10%; grid frequency: 50Hz±1Hz;
altitude: altitude not exceeding 1000m;
temperature: storage environment temperature -20°C ～60℃; working environment temperature: -5℃～40℃;
protection: no large dust, corrosive or explosive gas, conductive dust and other air pollution damage;
3. Test parameters
reverse recovery charge Qrr;
reverse recovery current IRM ;
Reverse recovery time trr;
reverse recovery current change rate dIF/dt;
diode forward current IF;
diode reverse voltage VR
contact: 15249202572