Hello everyone, I remember Cheng.
Recently, there was a problem with the Schottky diode in the project, and it was damaged probabilistically. The diode was originally a very simple device. This time I reorganized it for your reference.
The diode is damaged, and my personal summary has the following situations.
1. Overvoltage
At Ta=25°C, if the maximum reverse voltage VR of the diode is exceeded, the diode may be broken down, resulting in damage.
2. Overcurrent
Io: Average rectified forward current, which means the average rectified forward current. This current is continuous. The current flowing through the diode in normal operation does not exceed 200mA, and the diode is no problem.
The diode also has a current parameter, IFSM: Peak forward surge current, which means the peak forward surge current. This current is non- repetitive and can be seen in the test conditions of this parameter.
The waveform of the IFSM test is a 60Hz half-sine wave with a pulse width of 8.3ms and a cycle of 16.6ms.